All kind of time-of-flight-spectroscopy and -microscopy, 3D imaging in atom probe microscopy, time correlated electron-, X-ray-, UV-spectroscopy and -microscopy, photoemission electron microscopy (PEEM), mass spectrometry, and medium energy ion scattering (MEIS). Delay line detectors are outclassing all conventional MCP/CCD particle imagers by far better reliability of the counting response, by extremely low noise as well as by a wide variation of modern gating capabilities.