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Electro optical Terahertz pulsed Reflectometry

THz TDR analysis of semiconductor packages. Injected terahertz pulse reflects off faults within the device under test (DUT) locating their position with accuracy of 10 μm.

  • Non-destructive rapid fault isolation - minutes rather than days
  • Ability to isolate faults unseen with other fault isolation technologies (ex.conventional TDR)
  • Identification of weak connections that may lead to future faults
  • Isolation of shorts, dead opens, and resistive opens
  • 10 micron accuracy

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