Liquid Helium, Liquid Nitrogen and Cryogen Free - Micro-manipulated Probe Systems
Liquid Helium, Liquid Nitrogen and Cryogen Free
Micro-manipulated Cryogenic & Vacuum Probe Systems for Chips, Wafers and Device Testing from ~3.5 K to 675 K
Janis micro-manipulated probe stations are designed for non-destructive electrical testing using DC, RF, and fiber-optic probes. They are useful in a variety of fields including semiconductors, MEMS, superconductivity, electronics, ferroelectrics, material science, physics and optics. Either LHe/LN2 or a mechanical closed cycle refrigerator provides cooling. Different models locate the sample in ultra-high vacuum (UHV), ultra-high temperature (to 675 K), and magnetic field.
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