The Probe station is available with accessories such as special cables, calibration software, and industry-leading probes that help you position, calibrate, and characterize your device under test
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Optimised for I-V, C-V measurements of device and wafer characterization tests, failure analysis, sub-micron probing, MEMS, optoelectronic engineering tests and more
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Stable platen mounted with up to 6 micropositioners.
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Solid station frame with Built-in vibration-isolations
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Option of High resolution top side microscope
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Quick and ergonomic sample change
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Electrical Measurement Breakout Box with BNC breakout, suitable for measurements using Parameter Analyzers or Sourcemeters, Multimeters etc.